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Proceedings Paper

Infrared imaging systems for thermal mapping of fluid surfaces in convective states
Author(s): Antonio Verga
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Paper Abstract

Infrared systems are becoming essential part of the diagnostics of Fluid Physics Facilities thanks to their capability to visualize thermal flows on fluid surfaces. In fact, one of the main objectives of the research in this field is to monitor changes in the surface temperature of a liquid following the application of different stimuli. The only way to achieve this without disturbing the fluid under test is to use nonintrusive infrared measurement techniques. The scientific community demands systems able to provide real time temperature maps in the range from 0 degree(s)C to 80 degree(s)C with a frame rate of five images per second at least and typical resolution in the order of 0.2 degree(s)C. A 100 X 100 mm2 field of view is generally observed with a geometrical resolution as fine as 1 mm. These performances allow one to follow the evolution of the complex phenomena related to the heat convection and mass transport effects at the surface of fluids. In weightlessness condition, convection driven by surface tension is the only form of thermal convection because of the zeroing of buoyancy forces; observation of the free liquid interface may therefore provide important results for its interpretation. This paper deals with the use of Infrared Scanners to reconstruct the temperature distribution across the surface of fluids subjected to thermal gradients. The technical problems involved in this application are discussed. Finally, a review of the results achieved so far and the future possibilities are presented.

Paper Details

Date Published: 30 September 1994
PDF: 15 pages
Proc. SPIE 2210, Space Optics 1994: Space Instrumentation and Spacecraft Optics, (30 September 1994); doi: 10.1117/12.188087
Show Author Affiliations
Antonio Verga, European Space Agency/ESTEC (Netherlands)

Published in SPIE Proceedings Vol. 2210:
Space Optics 1994: Space Instrumentation and Spacecraft Optics
Thierry M. Dewandre; Joachim J. Schulte-in-den-Baeumen; Emmanuel Sein, Editor(s)

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