Share Email Print

Proceedings Paper

Residual stress birefringence in ZnSe and multispectral ZnS
Author(s): Steven P. Rummel; Herman E. Reedy; Gary L. Herrit
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Birefringence is an important factor in determining the imaging quality of visible and infrared optical systems. This paper presents residual birefringence data obtained at 0.6328 micrometers and 10.591 micrometers from several ZnSe and multispectral grade ZnS windows. Refractive index inhomogeneity tests were also performed on the samples at 0.6328 micrometers and their results are given. Residual birefringence data at 0.6328 micrometers is compared to data at 10.591 micrometers .

Paper Details

Date Published: 28 September 1994
PDF: 10 pages
Proc. SPIE 2286, Window and Dome Technologies and Materials IV, (28 September 1994); doi: 10.1117/12.187335
Show Author Affiliations
Steven P. Rummel, II-VI Inc. (United States)
Herman E. Reedy, II-VI Inc. (United States)
Gary L. Herrit, II-VI Inc. (United States)

Published in SPIE Proceedings Vol. 2286:
Window and Dome Technologies and Materials IV
Paul Klocek, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?