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Proceedings Paper

Near-edge structure in the soft x-ray quantum efficiency of microchannel plate (MCP) detectors
Author(s): George W. Fraser; John Ernest Lees; James F. Pearson; Anthony P. Nichols; P. Bailey
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Paper Abstract

We describe our recent synchrotron measurements of microchannel plate (MCP) quantum detection efficiency made in pulse-counting mode in a 40-300 eV band containing the L shell absorption edges of silicon. The significance of this data for the calibration of the HRC-S transmission grating detector for the AXAF-I X-ray observatory is discussed.

Paper Details

Date Published: 16 September 1994
PDF: 8 pages
Proc. SPIE 2280, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V, (16 September 1994); doi: 10.1117/12.186803
Show Author Affiliations
George W. Fraser, Univ. of Leicester (United Kingdom)
John Ernest Lees, Univ. of Leicester (United Kingdom)
James F. Pearson, Univ. of Leicester (United Kingdom)
Anthony P. Nichols, Univ. of Leicester (United Kingdom)
P. Bailey, DRAL Daresbury Lab. (United Kingdom)

Published in SPIE Proceedings Vol. 2280:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy V
Oswald H. W. Siegmund; John V. Vallerga, Editor(s)

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