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Proceedings Paper

Polarization errors associated with birefringent waveplates
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Paper Abstract

Although zero-order quartz waveplates are widely used in instrumentation that needs good temperature and field-of-view characteristics, the residual errors associated with these devices can be very important in high resolution polarimetry measurements. This paper will discuss how the field-of-view characteristics are affected by retardation errors and the misalignment of optic axes in a double crystal waveplate. The paper will then describe the retardation measurements that were made on zero-order quartz and single-order `achromatic' waveplates and how the misalignment errors affect those measurements.

Paper Details

Date Published: 14 September 1994
PDF: 12 pages
Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); doi: 10.1117/12.186698
Show Author Affiliations
Edward A. West, NASA Marshall Space Flight Ctr. (United States)
Matthew H. Smith, NASA Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 2265:
Polarization Analysis and Measurement II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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