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Proceedings Paper

Ellipsometric measurements applied to liquid crystal display technology
Author(s): Leonard G. Hale; Donald B. Taber; Eric Schonning; Donato Rizzi; William J. Gunning III; John P. Eblen Jr.
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Paper Abstract

Variable angle transmission ellipsometry has been used to characterize the various elements of the liquid crystal display (LCD) architecture. Ellipsometric data, which are in the form of polarization ellipses as a function of incident angle, are analyzed using the 2 X 2 extended Jones matrix formalism. Information which can be deduced from the ellipsometric data includes the birefringence, cell gap, twist angle, and pretilt angle of the liquid crystal cell, polarization efficiency of the polarizers, as well as the retardation values of birefringent compensators. The ellipsometric method is capable of complete characterization of the polarization state of the transmitted light.

Paper Details

Date Published: 14 September 1994
PDF: 8 pages
Proc. SPIE 2265, Polarization Analysis and Measurement II, (14 September 1994); doi: 10.1117/12.186664
Show Author Affiliations
Leonard G. Hale, Rockwell International Science Ctr. (United States)
Donald B. Taber, Rockwell International Science Ctr. (United States)
Eric Schonning, Rockwell International Science Ctr. (United States)
Donato Rizzi, Rockwell International Science Ctr. (United States)
William J. Gunning III, Rockwell International Science Ctr. (United States)
John P. Eblen Jr., Rockwell International Science Ctr. (United States)


Published in SPIE Proceedings Vol. 2265:
Polarization Analysis and Measurement II
Dennis H. Goldstein; David B. Chenault, Editor(s)

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