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Proceedings Paper

Analysis of near field data of diffused channel waveguides: an accurate method to obtain delta-n and the index profile
Author(s): Anurag Sharma; Pushpa Bindal
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Paper Abstract

A simple and reliable method for obtaining the index profile and the value of (Delta) n of diffused planar and channel waveguides from the near-field scan data is presented. The method involves fitting of the Hermite-Gauss functions to the near-field scan data; the implicit assumption in case of channel waveguides being the separability of the field in its dependence of the two transverse coordinates (x and y). The coefficients of expansion are then used to obtain two 1D index profiles. These two profiles are then suitably combined to give the index profile and the value of (Delta) n of channel waveguides. The validity of the procedure is first tested on planar waveguides. Our simulations show that the method is very stable with respect random errors up to 15 - 20% in the intensity, and accurate estimated for (Delta) n can be reliably obtained. For diffused channel waveguides also, our simulation studies show that the method yields very good estimates for (Delta) n with typical errors being less than a few percent.

Paper Details

Date Published: 25 August 1994
PDF: 12 pages
Proc. SPIE 2212, Linear and Nonlinear Integrated Optics, (25 August 1994); doi: 10.1117/12.185106
Show Author Affiliations
Anurag Sharma, Indian Institute of Technology/Delhi (India)
Pushpa Bindal, Indian Institute of Technology/Delhi (India)

Published in SPIE Proceedings Vol. 2212:
Linear and Nonlinear Integrated Optics
Giancarlo C. Righini; David Yevick, Editor(s)

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