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Proceedings Paper

High-resolution stimulated resonant Raman spectroscopy of I2 in the X1-sigma0 +g(v+0, J=13) state
Author(s): A. Goncharov; F. Du Burck; N. Courtier; D. M. Gorlicki; G. Camy; Christian J. Borde
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Paper Abstract

Stimulated resonant Raman (SRR) processes have beai widely used for high precision spectroscopy of atoms and molecules [1], especially when the levels of interest are metastable. Owing to the long lifetime of these levels, one may obtain extremely narrow SRR resonances which are useful both for spectroscopic and metrological applications [2]. There is a close analogy between the SRR interactioo of the three-level systn with two laser beams at frequencies vi ,V2 , and the interaction of the two ground level hyperfine states with a microwave radiatii at the frequency (v1 -v2). Because of this analogy, our experiment has soiue commoo features with that of optical miaowave double resonance [3], but it provides a better signal-to-noise ratio and a simpler experimental set-up. The present paper illusirales how useful SRR spectroscopy can be for the study of hyperfine sucture of the ground electrouic state of 12. We have indeed observed SRR transitions between hyperfine sublevels of the ground elecnothc state x1: ÷ (v=O,J= 13) of 2 flffOWf than 10 kHz (HWHM) have been obtained. We have measured Og six byperfine transitions with a 0.2 kHz accuracy. A pressure broadening of the SRR transitions equal to 7 1 kHzimtorr has been found. A third-order calculation of the line shape based on the diagrammatic representation of the density matrix equations is presented. The experimental line shapes of the SRR resonances are in good qualitative agreement with the results of the calculation. The advantages of this method for higb precision spectroscopy of iodine are thwusse .

Paper Details

Date Published: 10 August 1994
PDF: 7 pages
Proc. SPIE 2097, Laser Applications, (10 August 1994); doi: 10.1117/12.183149
Show Author Affiliations
A. Goncharov, Institute of Physics (Ukraine)
F. Du Burck, Univ. Paris-Nord (France)
N. Courtier, Univ. Paris-Nord (France)
D. M. Gorlicki, Univ. Paris-Nord (France)
G. Camy, Univ. Paris-Nord (France)
Christian J. Borde, Univ. Paris-Nord (France)

Published in SPIE Proceedings Vol. 2097:
Laser Applications
Artur A. Mak, Editor(s)

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