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Proceedings Paper

Multilayer buffer system for fabrication of high-Tc edge-geometry superconductor/normal-metal superconductor (SNS) weak links on silicon-on-sapphire substrates
Author(s): Brian D. Hunt; Marc C. Foote; W. T. Pike; Jeff B. Barner; Richard P. Vasquez
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Paper Abstract

High frequency detector and circuit applications often require device fabrication on medium-to-low dielectric constant substrates ((epsilon) < 12). Silicon-on-sapphire (SOS) substrates have acceptably low dielectric constants and provide other important advantages, including the possibility of monolithic integration of silicon and superconducting circuitry. Our initial results with YBa2Cu3O7-x(YBCO) edge- geometry superconductor/normal-metal/superconductor (SNS) weak links fabricated on r-plane SOS substrates using cubic zirconia (YSZ) buffer layers revealed problems with grain boundary nucleation in the YBCO counterelectrode. These results motivated development of a new multilayer buffer system consisting of an epitaxial YSZ film grown on an SOS substrate, overlaid by a thin YBCO 'seed' layer, and an epitaxial SrTiO3 (STO) layer. STO - YBCO bilayers grown over the YBCO seed layer show a remarkable improvement in epitaxial quality and in YBCO electrical properties relative to similar bilayers grown directly on the YSZ buffer. In addition, SNS weak links fabricated on SOS substrates using the multilayer buffer system exhibit dramatically improved electrical characteristics compared to devices produced on YSZ buffer layers. These are the first epitaxial edge-geometry SNS weak links produced on SOS substrates.

Paper Details

Date Published: 2 July 1994
PDF: 10 pages
Proc. SPIE 2160, Superconductive Devices and Circuits, (2 July 1994); doi: 10.1117/12.180986
Show Author Affiliations
Brian D. Hunt, Jet Propulsion Lab. (United States)
Marc C. Foote, Jet Propulsion Lab. (United States)
W. T. Pike, Jet Propulsion Lab. (United States)
Jeff B. Barner, Jet Propulsion Lab. (United States)
Richard P. Vasquez, Jet Propulsion Lab. (United States)

Published in SPIE Proceedings Vol. 2160:
Superconductive Devices and Circuits
Robert A. Buhrman; John T. Clarke; Ken Daly; Roger H. Koch; Jerome A. Luine; Randy W. Simon, Editor(s)

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