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Proceedings Paper

Characterization of microoptical elements by a stand-alone atomic-force microscope
Author(s): J. Rgen Burger; Nicholas X. Randall; Rainer F. Christoph; Lei Yan; Olivier M. Parriaux
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Paper Abstract

The microfabrication of optical and micromechanical elements requires a high degree of accuracy in order to obtain the required efficiency in the functionality of the element. An easy, nondestructive 3D characterization of the batch fabricated elements after each fabrication step is needed to ensure a reliable engineering control over the whole process. We demonstrate the versatility of a stand-alone AFM which can be used as a flexible tool for the nondestructive characterization of all steps of a fabrication sequence of microfabricated optical and micromechanical elements without the necessity to specially prepare the samples under test.

Paper Details

Date Published: 28 July 1994
PDF: 6 pages
Proc. SPIE 2213, Nanofabrication Technologies and Device Integration, (28 July 1994); doi: 10.1117/12.180984
Show Author Affiliations
J. Rgen Burger, CSEM (Switzerland)
Nicholas X. Randall, CSEM (Switzerland)
Rainer F. Christoph, CSEM (Switzerland)
Lei Yan, CSEM (Switzerland)
Olivier M. Parriaux, CSEM (Switzerland)

Published in SPIE Proceedings Vol. 2213:
Nanofabrication Technologies and Device Integration
Wolfgang Karthe, Editor(s)

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