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Proceedings Paper

Participation of laser-induced waveguide modes in optical damage of transparent dielectrics
Author(s): Mikhail N. Libenson; Vladimir S. Makin; V. A. Shiryaev; M. J. Soileau
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Paper Abstract

Possible mechanisms of formation of interference surface periodical structures (SPS) in the case of optical damage of transparent media are discussed. Such structures were discovered many years ago, when the action ofpulsed laser radiation ofmedium infrared and near infrared on alkali-halide and semiconductor crystals. The period of SPS, for normal incidence of the radiation on dielectrics is equal approximately to light wavelength in the dielectric. In this case the structures are formed on exit surface preferably and their ripples are orientated perpendicular to light field. Limitations of known models of phenomenon are examined (for example, ideas based on either surface quasi-stationary dipoles or surface polaritons on dielectric boundary) when surface-active medium is either a gas damage plasma or an erosion plasma oftarget material. In this work the author proposes a model for SPS formation based on laser generation of waveguide modes in a subsurface layer of dielectric materials. Thermo-optical changes of refraction index due to subsurface heating are considered as the main cause of the induced waveguide. The theoretical analysis takes into account the difference between light field distributions near the entrance and exit surfaces of a sample.

Paper Details

Date Published: 28 July 1994
PDF: 2 pages
Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); doi: 10.1117/12.180904
Show Author Affiliations
Mikhail N. Libenson, S.I. Vavilov State Optical Institute (Russia)
Vladimir S. Makin, S.I. Vavilov State Optical Institute (Russia)
V. A. Shiryaev, S.I. Vavilov State Optical Institute (Russia)
M. J. Soileau, CREOL/Univ. of Central Florida (United States)

Published in SPIE Proceedings Vol. 2114:
Laser-Induced Damage in Optical Materials: 1993
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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