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Proceedings Paper

Laser damage issues for mid-IR optical parametric oscillator mirrors
Author(s): Jonathan R. Milward; Keith L. Lewis; Andrew M. Pitt; J. Kirton; R. B. Overend; Desmond R. Gibson; J. Leonard; A. Hendry
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Paper Abstract

A study has been carried out of the design and fabrication of mirrors for Optical Parametric Oscillators (OPOs) operating in the mid-infrared using a variety of coating and substrate materials. The major considerations determining the choice of coating materials are refractive index excursion (determines bandwidth of mirror), optical bandgap (multi-photon effects at the pump wavelength), and porosity (adsorbed water causes absorption features in the tuning range of the OPO). The mirror coatings are mostly of quarter wave type design, and have been fabricated from chalcogenides, fluorides and oxides. The mirrors have been evaluated at repetition rates and pulse lengths similar to those encountered in operation of the OPO, at both the pump (1.064 and 2.1 micrometers ) and typical output wavelengths. Damage data has been gathered for a number of mirrors which form part of the OPO cavity. Second Harmonic Generation was observed at 1.064 micrometers in Cleartran ZnS substrates.

Paper Details

Date Published: 28 July 1994
PDF: 11 pages
Proc. SPIE 2114, Laser-Induced Damage in Optical Materials: 1993, (28 July 1994); doi: 10.1117/12.180891
Show Author Affiliations
Jonathan R. Milward, Defence Research Agency (United Kingdom)
Keith L. Lewis, Defence Research Agency (United Kingdom)
Andrew M. Pitt, Defence Research Agency (United Kingdom)
J. Kirton, Defence Research Agency (United Kingdom)
R. B. Overend, Pilkington Optronics, Barr & Stroud (United Kingdom)
Desmond R. Gibson, Pilkington Optronics, Barr & Stroud (United Kingdom)
J. Leonard, OCLI Optical Coatings (United Kingdom)
A. Hendry, OCLI Optical Coatings (United Kingdom)

Published in SPIE Proceedings Vol. 2114:
Laser-Induced Damage in Optical Materials: 1993
Harold E. Bennett; Lloyd L. Chase; Arthur H. Guenther; Brian Emerson Newnam; M. J. Soileau, Editor(s)

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