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Proceedings Paper

Low-background optical simulator for focal plane array testing
Author(s): Bernard J. Isker III; Hai N. Dang; James W. Holloway
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Paper Abstract

System-level performance testing of IR focal plane arrays (FPAs) at low background flux has been demonstrated prior to system- level integration using an optical simulator designed at the Hughes Technology Center. The optical simulator uses 30K cooled reflective optics and scanner to focus a 55 micrometers diameter spot on the array under test. The scanner can be synchronized with the array's on-chip time delay and integration (TDI) functions to simulate system-level FPA performance. The optical simulator design incorporates a separately detachable dewar to allow the device under test to be changed without warming up the optics. The optical simulator was designed to test devices in the 3 micrometers to 30 micrometers region and contains cooled background and signal wheels which allow for testing at multiple wavelengths and background flux levels. This paper describes the optical simulator and presents the initial test data obtained.

Paper Details

Date Published: 8 July 1994
PDF: 9 pages
Proc. SPIE 2224, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V, (8 July 1994); doi: 10.1117/12.180074
Show Author Affiliations
Bernard J. Isker III, Hughes Aircraft Co. (United States)
Hai N. Dang, Hughes Aircraft Co. (United States)
James W. Holloway, Hughes Aircraft Co. (United States)

Published in SPIE Proceedings Vol. 2224:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V
Gerald C. Holst, Editor(s)

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