Share Email Print

Proceedings Paper

Automated radiometric cryoprobe of IR focal plane array wafers
Author(s): Stephen L. Whicker
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Texas Instruments (TI) validated the feasibility of cryoprobing IRFPA arrays in late 1991. Since then, TI has developed a revolutionary automated cryoprobe for screening four and six inch wafers of IRFPAs. Generic prober automation features include cassette to cassette wafer load and unload, wafer alignment, black body selection, aperture selection, probe tip continuity test, and 77.5 degree(s) to 400 degree(s)K wafer temperature control. Modular construction of the prober enables placement of product specific components such as MWIR or LWIR bandpass filters, coldshield, coldfilter, probe card, and noise suppression circuitry on an easily removable `product specific' tooling plate. Prober operation is controlled through object oriented software. IRFPA specific software modules control array operation, data collection, and data reduction. In addition to describing the prober capabilities and versatility, this paper compares prober test data to lab dewar test data for 240 X 1 IRFPAs and projects benefits in reduced cycle time and labor savings.

Paper Details

Date Published: 13 July 1994
PDF: 5 pages
Proc. SPIE 2228, Producibility of II-VI Materials and Devices, (13 July 1994); doi: 10.1117/12.179669
Show Author Affiliations
Stephen L. Whicker, Texas Instruments Inc. (United States)

Published in SPIE Proceedings Vol. 2228:
Producibility of II-VI Materials and Devices
Herbert K. Pollehn; Raymond S. Balcerak, Editor(s)

© SPIE. Terms of Use
Back to Top