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X-ray photoelectron spectroscopy (XPS) studies on Zn/Cd selenide thin films grown by electron-beam deposition
Author(s): D. R. Rao; R. Islam
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Paper Abstract

Zn1 Cd Se ternary thin films were deposited by electron beam evaporation and their c~iition was examined using X-ray photoelectron spectroscopy (XPS). They all indicated a general selenium deficiency. The Auger parameter (~ ) and ionicity (f.) have been estimated fran XPS data. The variat:i.on of d hetween the different c~sitions is not very significant. The f. values are 0.650, 0.680 for 7.nSe and C"..d.Se films respectively.

Paper Details

Date Published: 13 July 1994
PDF: 7 pages
Proc. SPIE 2228, Producibility of II-VI Materials and Devices, (13 July 1994); doi: 10.1117/12.179657
Show Author Affiliations
D. R. Rao, Indian Institute of Technology (India)
R. Islam, Indian Institute of Technology (India)

Published in SPIE Proceedings Vol. 2228:
Producibility of II-VI Materials and Devices
Herbert K. Pollehn; Raymond S. Balcerak, Editor(s)

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