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Proceedings Paper

Tomographic image reconstruction and rendering with texture-mapping hardware
Author(s): Stephen G. Azevedo; Brian K. Cabral; Jim Foran
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Paper Abstract

The image reconstruction problem, also known as the inverse Radon transform, for x-ray computed tomography (CT) is found in numerous applications in medicine and industry. The most common algorithm used in these cases is filtered backprojection (FBP), which, while a simple procedure, is time-consuming for large images on any type of computational engine. Specially designed, dedicated parallel processors are commonly used in medical CT scanners, whose results are then passed to a graphics workstation for rendering and analysis. However, a fast direct FBP algorithm can be implemented on modern texture-mapping hardware in current high-end workstation platforms. This is done by casting the FBP algorithm as an image warping operation with summing. Texture- mapping hardware, such as that on the silicon Graphics Reality Engine, shows around 600 times speedup of backprojection over a CPU-based implementation (a 100 Mhz R4400 in our case). This technique has the further advantages of flexibility and rapid programming. In addition, the same hardware can be used for both image reconstruction and for volumetric rendering. Our technique can also be used to accelerate iterative reconstruction algorithms. The hardware architecture also allows more complex operations than straight-ray backprojection if they are required, including fan-beam, cone-beam, and curved ray paths, with little or no speed penalties.

Paper Details

Date Published: 8 July 1994
PDF: 12 pages
Proc. SPIE 2299, Mathematical Methods in Medical Imaging III, (8 July 1994); doi: 10.1117/12.179259
Show Author Affiliations
Stephen G. Azevedo, Lawrence Livermore National Lab. (United States)
Brian K. Cabral, Silicon Graphics Computer Systems (United States)
Jim Foran, Silicon Graphics Computer Systems (United States)

Published in SPIE Proceedings Vol. 2299:
Mathematical Methods in Medical Imaging III
Fred L. Bookstein; James S. Duncan; Nicholas Lange; David C. Wilson, Editor(s)

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