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Proceedings Paper

Visible wavelength Doppler Lidar for measurement of wind and aerosol profiles during day and night
Author(s): Wilbert R. Skinner; Kenneth W. Fischer; Vincent J. Abreu; Matthew J. McGill; Todd D. Irgang; John E. Barnes
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Paper Abstract

The University of Michigan's Space Physics Research Laboratory has constructed a mobile high-spectral-resolution Doppler lidar capable of measuring wind and aerosol loading profiles in the troposphere and lower stratosphere. The system uses a 3-W pulsed frequency-doubled Nd:YAG laser operating at 532 nm as the active source. Backscattered signal is collected by a 44.4-cm-diameter Newtonian telescope. A two axis mirror scanning system allows the instrument to achieve full sky coverage. A pair of Fabry-Perot interferometers in combination with a narrowband (0.1nm) interference filter are used to filter daylight background and provide a high spectral resolving element to measure the Doppler shift. In addition, the aerosol and molecular scattered components of the signal can be separated, giving a measure of the relative aerosol loading. Measurements have been made day and night in the boundary layer with vertical resolution of 100 m and a temporal resolution of approximately 5 minutes. Accuracy of the wind velocity is on the order of 1 to 2 m/s in the boundary layer.

Paper Details

Date Published: 3 June 1994
PDF: 11 pages
Proc. SPIE 2112, Tunable Diode Laser Spectroscopy, Lidar, and DIAL Techniques for Environmental and Industrial Measurements, (3 June 1994); doi: 10.1117/12.177302
Show Author Affiliations
Wilbert R. Skinner, Univ. of Michigan (United States)
Kenneth W. Fischer, Univ. of Michigan (United States)
Vincent J. Abreu, Univ. of Michigan and CIESIN (United States)
Matthew J. McGill, Univ. of Michigan (United States)
Todd D. Irgang, Univ. of Michigan (United States)
John E. Barnes, Univ. of Michigan (United States)


Published in SPIE Proceedings Vol. 2112:
Tunable Diode Laser Spectroscopy, Lidar, and DIAL Techniques for Environmental and Industrial Measurements
Alan Fried; Dennis K. Killinger; Harold I. Schiff, Editor(s)

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