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Proceedings Paper

Franco-Mexican Differential Speckle Interferometer
Author(s): Salvador Cuevas; Romain Gueorguiev Petrov; Alain Chelli; Stephane Lagarde; Andre Couve; Silvio J. Tinoco; Leonardo J. Sanchez
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Paper Abstract

Differential speckle interferometry is based on the cross analysis of series of speckle patterns produced in different wavelengths. The study of the position differences between these speckles provides angular information on objects much smaller than the diffraction limit. In order to make the measurements of the photocenter displacement, we have built an instrument which behaves like a spectrograph in one direction and a speckle interferometer in the perpendicular direction. A mirror anamorphoser permits us to meet the different sampling requirements. The dispersed speckle pattern is recorded by a photon counting camera. The measurements of the photocenter displacements are very sensitive to differences of aberration between spectral channels and temporal variations of the detector's distorsion. Our instrument provides images with a quality equal to the diffraction limit plus residual aberrations of the order of one hundreth of the wavelength used. The distorsion of the optics is much smaller than the size of the temporal variations of the detector's distorsion. In order to correct this variable distorsion, spatial and spectral modulations are made in a fully automated instrument.

Paper Details

Date Published: 9 June 1994
PDF: 11 pages
Proc. SPIE 2200, Amplitude and Intensity Spatial Interferometry II, (9 June 1994); doi: 10.1117/12.177280
Show Author Affiliations
Salvador Cuevas, Instituto de Astronomia-UNAM (Mexico)
Romain Gueorguiev Petrov, Univ. de Nice-Sophia Antipolis (France)
Alain Chelli, Observatoire de Grenoble (France)
Stephane Lagarde, Univ. de Nice-Sophia Antipolis (France)
Andre Couve, Univ. de Nice-Sophia Antipolis (France)
Silvio J. Tinoco, Instituto de Astronomia-UNAM (Mexico)
Leonardo J. Sanchez, Univ. de Nice-Sophia Antipolis (Mexico)

Published in SPIE Proceedings Vol. 2200:
Amplitude and Intensity Spatial Interferometry II
James B. Breckinridge, Editor(s)

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