Share Email Print

Proceedings Paper

Strategy for reliability qualification of nonhermetic laser modules
Author(s): John W. Osenbach; Robert B. Comizzoli
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The availability of a reliable, non-hermetic InP based laser and associated monitor diode could provide the cost reduction needed for wide spread use of such lasers for two way broad band communication. Since there is little information available in the reliability of such devices in non-hermetic packages, a strategy for carrying out life testing in humid environments is presented. Accelerated aging tests can be used to assess the reliability of presently available devices and to discover the failure modes. Detailed failure analysis provides understanding of the physics and chemistry of the failure mechanism and leads to design and material improvements to prevent these failure mechanisms. The basic assumption underlying accelerated testing and the physical basis for the derivation of acceleration factors are discussed. Proper design of the accelerated test and selection of test conditions are essential for the derivation of useful temperature and humidity acceleration factors. These acceleration factors are determined from analyses of the time-to-failure as a function of both parameters. Finally, the possibility of condensation and its effects on a laser-monitor assembly are discussed.

Paper Details

Date Published: 1 June 1994
PDF: 13 pages
Proc. SPIE 2148, Laser Diode Technology and Applications VI, (1 June 1994); doi: 10.1117/12.176635
Show Author Affiliations
John W. Osenbach, AT&T Bell Labs. (United States)
Robert B. Comizzoli, AT&T Bell Labs. (United States)

Published in SPIE Proceedings Vol. 2148:
Laser Diode Technology and Applications VI
Pei Chuang Chen; Lawrence A. Johnson; Henryk Temkin, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?