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Proceedings Paper

TlBa2Ca2Cu3O9 film for detection of visible and far-infrared radiation
Author(s): Rainer S. Nebosis; M. A. Heusinger; Wolfgang Schatz; A. Piehler; R. Loew; N. Reschauer; Karl F. Renk; Alex D. Semenov; Pavel B. Kouminov; Ivane G. Goghidze; Eugeni M. Gershenzon
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Paper Abstract

Fast resistive response of structured TiBa2Ca2Cu3O9 thin film to visible and far-infrared pulsed radiation has been observed for the first time. The voltage response of a current biased film was induced by a Nd:YAG laser in the visible and by an optically pumped Raman laser in the far-infrared range. Fast components of the response with a duration limited by the temporal resolution of the readout systems were observed in both spectral ranges. Each signal pulse consisted of a fast component that was followed by a slower decaying signal. We attributed the slow decay, with a time constant of few ns, to bolometric effects. The fast component of the response was most likely due to the depression of superconductivity by light induced nonequilibrium quasiparticles. The high temporal resolution, a large range of responsivity of few mV/W of the structured film represent a very powerful detector performance.

Paper Details

Date Published: 20 May 1994
PDF: 4 pages
Proc. SPIE 2159, High-Temperature Superconducting Detectors: Bolometric and Nonbolometric, (20 May 1994); doi: 10.1117/12.176132
Show Author Affiliations
Rainer S. Nebosis, Univ. of Regensburg (Germany)
M. A. Heusinger, Univ. of Regensburg (Germany)
Wolfgang Schatz, Univ. of Regensburg (Germany)
A. Piehler, Univ. of Regensburg (Germany)
R. Loew, Univ. of Regensburg (Germany)
N. Reschauer, Univ. of Regensburg (Germany)
Karl F. Renk, Univ. of Regensburg (Germany)
Alex D. Semenov, Moscow State Pedagogical Univ. (Russia)
Pavel B. Kouminov, Moscow State Pedagogical Univ. (Russia)
Ivane G. Goghidze, Moscow State Pedagogical Univ. (Russia)
Eugeni M. Gershenzon, Moscow State Pedagogical Univ. (Russia)

Published in SPIE Proceedings Vol. 2159:
High-Temperature Superconducting Detectors: Bolometric and Nonbolometric
Michael Nahum; Jean-Claude Villegier, Editor(s)

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