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Proceedings Paper

Measurement and simulation of photoluminescence spectra from vertical-cavity quantum-well laser structures
Author(s): David T. Schaafsma; Robert K. Hickernell; David H. Christensen
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Paper Abstract

We compare photoluminescence data collected in either a surface-normal configuration (NPL) or with the pump and collection paths perpendicular to a cross-section of the epitaxial layers (XPL) for various vertical-cavity surface-emitting lasers and distributed quantum well structures. We report the spatial resolution of the XPL technique, particularly as it applies to distinguishing features in complex multilayer structures. We assess a potential simulation method for transforming the perturbed NPL spectra into the unperturbed XPL spectra, taking into account a number of experimental and material parameters which may influence the lineshape. These factors include the pump field distribution and its influence on the weighting of the emitters, the collection optics, and the changes in the dispersive complex dielectric constant of the quantum wells. This information is of import not only to optimizing device manufacture, but to basic physical and materials research as well. Whereas the XPL technique is a relatively simple but destructive characterization tool, a complete understanding of NPL emission could be made to yield the same information via rapid, nondestructive means.

Paper Details

Date Published: 11 May 1994
PDF: 11 pages
Proc. SPIE 2139, Quantum Well and Superlattice Physics V, (11 May 1994); doi: 10.1117/12.175699
Show Author Affiliations
David T. Schaafsma, National Institute of Standards and Technology (United States)
Robert K. Hickernell, National Institute of Standards and Technology (United States)
David H. Christensen, National Institute of Standards and Technology (United States)

Published in SPIE Proceedings Vol. 2139:
Quantum Well and Superlattice Physics V
Gottfried H. Doehler; Emil S. Koteles, Editor(s)

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