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Proceedings Paper

Effect of geometrical distortion correction in MR on image registration accuracy
Author(s): Calvin R. Maurer Jr.; Georges B. Aboutanos; Benoit M. Dawant; Srikanth Gadamsetty; Richard A. Margolin; Robert J. Maciunas; J. Michael Fitzpatrick
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Paper Abstract

In this paper we investigate the effect of geometrical distortion correction in magnetic resonance (MR) images on the accuracy of the registration of x-ray computed tomography (CT) and MR head images for a fiducial marker (extrinsic point) method and a surface matching technique. We used CT and T2-weighted MR volume images acquired from seven patients who underwent craniotomies in a stereotactic neurosurgical clinical trial. Each patient had four external markers attached to transcutaneous post screwed into the outer table of the skull. We define registration error as the distance between corresponding marker positions after registration and transformation. The accuracy of the fiducial marker method was determined by using each combination of three markers to estimate the transformation and the remaining marker to calculate registration error. Surface-based registration was accomplished by fitting MR contours corresponding to the CSF-dura interface to CT contours derived from the inner surface of the skull. Correction of geometrical distortion in MR images significantly reduced the registration error of both point-based and surface-based registration.

Paper Details

Date Published: 11 May 1994
PDF: 14 pages
Proc. SPIE 2167, Medical Imaging 1994: Image Processing, (11 May 1994);
Show Author Affiliations
Calvin R. Maurer Jr., Vanderbilt Univ. (United States)
Georges B. Aboutanos, Vanderbilt Univ. (United States)
Benoit M. Dawant, Vanderbilt Univ. (United States)
Srikanth Gadamsetty, Vanderbilt Univ. (United States)
Richard A. Margolin, Vanderbilt Univ. (United States)
Robert J. Maciunas, Vanderbilt Univ. (United States)
J. Michael Fitzpatrick, Vanderbilt Univ. (United States)

Published in SPIE Proceedings Vol. 2167:
Medical Imaging 1994: Image Processing
Murray H. Loew, Editor(s)

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