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Proceedings Paper

Phase-strain model for polarimetric strain sensors based on fictitious residual strains
Author(s): Yu-Lung Lo; Peter Louring Nielsen; James S. Sirkis
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Paper Abstract

The development of a phenomenologically based phase-strain model for structurally embedded polarimetric sensors is presented and then applied to Bow-Tie and e-core high-birefringence optical fibers and a standard circular core low-birefringence optical fiber. This phase-strain model is developed by postulating the existence of a fictitious residual strain state in the optical fiber core, and then following standard model development techniques. Calibration procedures are used to determine all parameters required by this model.

Paper Details

Date Published: 1 May 1994
PDF: 7 pages
Proc. SPIE 2191, Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation, (1 May 1994); doi: 10.1117/12.173978
Show Author Affiliations
Yu-Lung Lo, Univ. of Maryland/College Park (United States)
Peter Louring Nielsen, Technical Univ. of Denmark (Denmark)
James S. Sirkis, Univ. of Maryland/College Park (United States)

Published in SPIE Proceedings Vol. 2191:
Smart Structures and Materials 1994: Smart Sensing, Processing, and Instrumentation
James S. Sirkis, Editor(s)

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