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Proceedings Paper

Combined scanning optical and force microscope using interferometric detection
Author(s): Christopher David Wright; Warwick W. Clegg; S. T. Cheng; P. J. Crozier; M. J. Cunningham; E. W. Hill; Kazuhiko Hayashi; J. K. Birtwistle
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Paper Abstract

The design and application of scanning probe microscope primarily intended for topographic, magnetic force and magneto-optical investigations of magnetic thin films is described. A microfabricated silicon tip is scanned across the sample of interest, and the tip deflection detected using a modified form of the den Boef twin beam interferometric system. Initial studies of the recorded bit structure in magnetic and magneto-optic storage media, and the magnetic field from a thin film recording head are reported.

Paper Details

Date Published: 1 March 1994
PDF: 8 pages
Proc. SPIE 2004, Interferometry VI: Applications, (1 March 1994); doi: 10.1117/12.172606
Show Author Affiliations
Christopher David Wright, Univ. of Manchester (United Kingdom)
Warwick W. Clegg, Univ. of Manchester (United Kingdom)
S. T. Cheng, Univ. of Manchester (United Kingdom)
P. J. Crozier, Univ. of Manchester (United Kingdom)
M. J. Cunningham, Univ. of Manchester (United Kingdom)
E. W. Hill, Univ. of Manchester (United Kingdom)
Kazuhiko Hayashi, NEC Corp. (Japan)
J. K. Birtwistle, Univ. of Manchester (United Kingdom)

Published in SPIE Proceedings Vol. 2004:
Interferometry VI: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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