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Proceedings Paper

Fractal surface and its measurement by computer simulation
Author(s): Siak-Piang Lim; Wei Min Shi
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Paper Abstract

In this paper, a zero-mean, band-limited Fractal function is introduced to simulate rough surface profile. According to the Kirchoff Theory, the surface roughness measurement is simulated with the help of the fast Fourier Transformation technology. The relationship between the surface parameters and the reflected light intensity distribution is obtained. In order to quantify rough surfaces, some criteria are proposed. Numerical results show that these criteria have a strong correlation with the root mean square of the surface height variation and they can be used for surface roughness measurement and classification.

Paper Details

Date Published: 1 March 1994
PDF: 5 pages
Proc. SPIE 2004, Interferometry VI: Applications, (1 March 1994); doi: 10.1117/12.172591
Show Author Affiliations
Siak-Piang Lim, National Univ. of Singapore (Singapore)
Wei Min Shi, National Univ. of Singapore (Singapore)

Published in SPIE Proceedings Vol. 2004:
Interferometry VI: Applications
Ryszard J. Pryputniewicz; Gordon M. Brown; Werner P. O. Jueptner, Editor(s)

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