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Proceedings Paper

X-ray and gamma-ray computed tomography for industrial nondestructive testing and evaluation
Author(s): Ian Costello; Peter Wells; John R. Davis; Nino Benci; David Skerrett; D. Rhys Davies
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Paper Abstract

This paper presents an overview of two recently constructed computed tomography (CT) scanners that have been designed to provide structural information for industrially relevant materials and components. CT enables cross-sectional slices of an object to be nondestructively imaged and represented as a map of linear attenuation coefficient. As linear attenuation is the product of mass attenuation and density, this usually enables a straightforward interpretation of the image in terms of density. The two instruments are a transportable scanner using a 160 kV(peak) powered x-ray tube for the inspection of wooden power poles up to 450 mm in diameter, and an industrial scanning system designed around an Ir-192 gamma-ray source for materials characterization and the testing and evaluation of castings, ceramics, and composites. The images presented in this paper have generally been reconstructed using the summation convolution back-projection (SCBP) method, and this technique is outlined. Direct Fourier reconstruction is also used and compared with the SCBP method. A brief discussion is offered on incorporating edge detection methods into the image reconstruction process for the improved identification of defects such as cracks and voids.

Paper Details

Date Published: 28 March 1994
PDF: 10 pages
Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); doi: 10.1117/12.171265
Show Author Affiliations
Ian Costello, National Teaching Co. Scheme Associate (Australia)
Peter Wells, Monash Univ. (Australia)
John R. Davis, Monash Univ. (Australia)
Nino Benci, Monash Univ. (Australia)
David Skerrett, Monash Univ. (Australia)
D. Rhys Davies, Monash Univ. (Australia)

Published in SPIE Proceedings Vol. 2092:
Substance Detection Systems
Geoffrey L. Harding; Richard C. Lanza; Lawrence J. Myers; Peter A. Young, Editor(s)

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