Share Email Print

Proceedings Paper

Active machine vision system for surface quality inspection
Author(s): Cor L. Claeys; Ingrid Debusschere; Nico Ricquier; Peter Seitz; Martin Stalder; Jeffrey M. Raynor; Graham K. Lang; Giuseppe Cilia; C. Cavanna; U. Muessigmann; A. Abele
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The realization of an integrated, flexible, and robust CIM vision system, suitable for performing quality-assurance surface inspections is discussed. The optimized combination of advanced optics, optomechanics, and flexible image sensor realizes a high 'virtual resolution' without penalizing the pixel transfer rate. High computation rates are obtained by complementing the fractal inspection algorithm with a dynamic hologram, a modular data flow processor, and the system computer. The integrated vision system is validated for the surface quality inspection of concrete tiles in an industrial environment. The overall system performance is discussed in detail and the potential of the system for other application fields will be addressed.

Paper Details

Date Published: 11 March 1994
PDF: 9 pages
Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); doi: 10.1117/12.171209
Show Author Affiliations
Cor L. Claeys, Interuniv. Micro-Elektronica Centrum vzw (Belgium)
Ingrid Debusschere, Interuniv. Micro-Elektronica Centrum vzw (Belgium)
Nico Ricquier, Interuniv. Micro-Elektronica Centrum vzw (Belgium)
Peter Seitz, Paul Scherrer Institut Zuerich (Switzerland)
Martin Stalder, Paul Scherrer Institut Zuerich (Switzerland)
Jeffrey M. Raynor, Paul Scherrer Institut Zuerich (Switzerland)
Graham K. Lang, Paul Scherrer Institut Zuerich (Switzerland)
Giuseppe Cilia, OPTEC s.r.l. (Italy)
C. Cavanna, OPTEC s.r.l. (Italy)
U. Muessigmann, Fraunhofer-Institut fuer Produktionstechnik (Germany)
A. Abele, Fraunhofer-Institut fuer Produktionstechnik (Germany)

Published in SPIE Proceedings Vol. 2183:
Machine Vision Applications in Industrial Inspection II
Benjamin M. Dawson; Stephen S. Wilson; Frederick Y. Wu, Editor(s)

© SPIE. Terms of Use
Back to Top