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Proceedings Paper

Defect detection in multilayered, plasma-sprayed zirconia by time-resolved infrared radiometry: a comparison between analytical and experimental methods
Author(s): P. Greig Happoldt; William A. Ellingson; Thomas P. Gardiner; John A. Krueger
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Paper Abstract

Analytical and experimental methods were used to study a series of test specimens consisting of plasma sprayed layers of NiCrA1Y I Zr02ofvarious compositions. The coatings were seeded with artificial defects and were sprayed on steel disks. Two types of defects were used: flat bottomed holes drilled in the steel substrate and patches of room temperature vulcanizing silicone within the coatings. Defect sizes ranged from 0. 1 to 10 mm and were at depths below the coating surface from 0.6 to 3.6 mm. The method of time resolved infrared radiometry was used with two different heat sources, an acetylene torch and a high intensity lamp, to inspect the coatings. The torch allowed excellent sensitivity at depths of less than 2 mm and the lamp revealed flaws through the full coating thickness. Two analytical models were developed to study heat flow in the test specimens: a finite element model and an electrical analog model. Results from the two models were compared to check consistency and the finite element model results were compared with experimental results. The finite element code was chosen for further development due to its greater flexibility and ease of use. This paper was presented at the Thermosense XV conference.

Paper Details

Date Published: 21 March 1994
PDF: 10 pages
Proc. SPIE 2245, Thermosense XVI: An International Conference on Thermal Sensing and Imaging Diagnostic Applications, (21 March 1994); doi: 10.1117/12.171184
Show Author Affiliations
P. Greig Happoldt, Caterpillar Inc. (United States)
William A. Ellingson, Argonne National Lab. (United States)
Thomas P. Gardiner, Argonne National Lab. (United States)
John A. Krueger, Argonne National Lab. (United States)

Published in SPIE Proceedings Vol. 2245:
Thermosense XVI: An International Conference on Thermal Sensing and Imaging Diagnostic Applications
John R. Snell Jr., Editor(s)

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