
Proceedings Paper
Application of wavelets to ultrasonic evaluation of thicknessFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Thickness evaluation of materials via ultrasound can have special requirements that make the application of wavelets desirable. The thickness information is extracted from ultrasound echoes, and it is the distance between these echoes which must be estimated. Due to typical rates involved in real-time applications, only a minimum amount of processing can be done. In this paper, the multiscale analysis induced by the wavelet transform is employed and compared against conventional techniques (matched filtering by direct and a FFT based approach) in terms of computational complexity. To meet the data rate involved, the fast wavelet transform is used in a manner to obtain the necessary position information. Steps are taken to compensate for the translation variance of the wavelet transform.
Paper Details
Date Published: 15 March 1994
PDF: 11 pages
Proc. SPIE 2242, Wavelet Applications, (15 March 1994); doi: 10.1117/12.170050
Published in SPIE Proceedings Vol. 2242:
Wavelet Applications
Harold H. Szu, Editor(s)
PDF: 11 pages
Proc. SPIE 2242, Wavelet Applications, (15 March 1994); doi: 10.1117/12.170050
Show Author Affiliations
Joel A. Rosiene, Univ. of Connecticut (United States)
H. Sholl, Univ. of Connecticut (United States)
Published in SPIE Proceedings Vol. 2242:
Wavelet Applications
Harold H. Szu, Editor(s)
© SPIE. Terms of Use
