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Proceedings Paper

Effects of radiation on long wavelength devices and fibers
Author(s): Alvin S. Kanofsky; Krishna Rao Linga
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Paper Abstract

We have measured the effects of radiation on various long wavelength diode devices using InGaAs technology. The various components were exposed to radiation of continuous electron and gamma beams at the Lehigh University Van de Graaff Radiation Facility and proton beams at the Brookhaven Tandem Facility.

Paper Details

Date Published: 1 March 1994
PDF: 7 pages
Proc. SPIE 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments, (1 March 1994); doi: 10.1117/12.168629
Show Author Affiliations
Alvin S. Kanofsky, Lehigh Univ. (United States)
Krishna Rao Linga, Epitaxx Inc. (United States)

Published in SPIE Proceedings Vol. 2074:
Fiber Optics Reliability and Testing: Benign and Adverse Environments
Dilip K. Paul; Hakan H. Yuce, Editor(s)

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