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Proceedings Paper

Proton radiation effects on various electro-optical devices
Author(s): Alvin S. Kanofsky; William J. Minford
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Paper Abstract

We have measured the effects of electron and proton radiation on LiNbO3 electro-optical devices. These include waveguides, switches, Mach-Zender interferometers, etc., of both Ti indiffused and proton exchange construction. The effects of continuous and pulsed beam in situ and out of situ were measured.

Paper Details

Date Published: 1 March 1994
PDF: 10 pages
Proc. SPIE 2074, Fiber Optics Reliability and Testing: Benign and Adverse Environments, (1 March 1994); doi: 10.1117/12.168628
Show Author Affiliations
Alvin S. Kanofsky, Lehigh Univ. (United States)
William J. Minford, AT&T Bell Labs. (United States)

Published in SPIE Proceedings Vol. 2074:
Fiber Optics Reliability and Testing: Benign and Adverse Environments
Dilip K. Paul; Hakan H. Yuce, Editor(s)

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