Share Email Print
cover

Proceedings Paper

Application of a charge-coupled device as an x-ray polarimeter
Author(s): Hiroshi Tsunemi; Kiyoshi Hayashida; Keisuke Tamura; Susumu Nomoto; Mikio Wada; Emi Miyata; Noriuki Miura
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We report here the results of polarized X-ray detection with a charge-coupled device (CCD). The photoelectron produced in the CCD is mainly ejected along the electric vector of the incident X-ray. This means that the primary charge cloud mainly remains in the depletion layer if the photo absorption occurs in it. Therefore, a primary charge cloud is elongated towards the X-ray polarization vector. The range of the electron in the silicon is roughly expressed (E/10 keV)1.75 micrometers where E is the electron energy in KeV. Therefore, the range of the photoelectron in this energy region is at most two-pixel length. We investigated the relation between the direction of the linear polarization of X-rays and the statistics of the charge cloud shape.

Paper Details

Date Published: 15 February 1994
PDF: 10 pages
Proc. SPIE 2010, X-Ray and Ultraviolet Polarimetry, (15 February 1994); doi: 10.1117/12.168581
Show Author Affiliations
Hiroshi Tsunemi, Osaka Univ. (Japan)
Kiyoshi Hayashida, Osaka Univ. (Japan)
Keisuke Tamura, Osaka Univ. (Japan)
Susumu Nomoto, Osaka Univ. (Japan)
Mikio Wada, Osaka Univ. (Japan)
Emi Miyata, Osaka Univ. (Japan)
Noriuki Miura, Osaka Univ. (Japan)


Published in SPIE Proceedings Vol. 2010:
X-Ray and Ultraviolet Polarimetry
Silvano Fineschi, Editor(s)

© SPIE. Terms of Use
Back to Top
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray