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Proceedings Paper

Characterization of fractal Brownian process in laser damaged photodiodes
Author(s): Woei-Yun Ho; Chun Chi Ma; Robert W. Bene; A. Bruce Buckman; Rodger M. Walser; Michael F. Becker
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Paper Abstract

Fractal characterization technique with spectral analysis of 1/f noise were used to study the carrier transport behavior in laser damage avalanche photodiodes. By computing correlation integral from the time series at embedding dimension M equals 2, we quantitatively characterized the random noise enhanced by laser-induced defects in laser damaged photodiodes. The lack of correlation between random noise and 1/f noise is the basis of the observation. It has been found that increasing random noise would change the characteristic features of 1/f noise spectrum. In this study, we proved that combining 1/f noise spectra, I-V curve measurements, and fractal characterization method could lead to a better understanding in the failure mechanism of laser damage to photodiodes.

Paper Details

Date Published: 1 March 1994
PDF: 12 pages
Proc. SPIE 2037, Chaos/Nonlinear Dynamics: Methods and Commercialization, (1 March 1994); doi: 10.1117/12.167526
Show Author Affiliations
Woei-Yun Ho, Univ. of Texas/Austin (United States)
Chun Chi Ma, Univ. of Texas/Austin (United States)
Robert W. Bene, Univ. of Texas/Austin (United States)
A. Bruce Buckman, Univ. of Texas/Austin (United States)
Rodger M. Walser, Univ. of Texas/Austin (United States)
Michael F. Becker, Univ. of Texas/Austin (United States)

Published in SPIE Proceedings Vol. 2037:
Chaos/Nonlinear Dynamics: Methods and Commercialization
Helena S. Wisniewski, Editor(s)

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