Proceedings Paper
Speckle pattern statistics analysis in human skin structure investigations| Format | Member Price | Non-Member Price |
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Paper Abstract
One of the important methods for the biomedical objects structure investigations is the statistical analysis of the partially developed speckle patterns formed in the output plane of the coherent scanning microscope (CSM). By means of CSM the speckle intensity's statistical properties for the samples of the human epidermis strippings have been investigated. The strippings under testing were considered as random phase screens with an unknown correlation length and phase deviation; for such objects the computer simulation of the laser light diffraction has been carried out.
Paper Details
Date Published: 1 February 1994
PDF: 9 pages
Proc. SPIE 2082, Quantification and Localization Using Diffuse Photons in a Highly Scattering Medium, (1 February 1994); doi: 10.1117/12.167450
Published in SPIE Proceedings Vol. 2082:
Quantification and Localization Using Diffuse Photons in a Highly Scattering Medium
Britton Chance; David T. Delpy; Marco Ferrari; Martin J. C. van Gemert; Gerhard J. Mueller; Valery V. Tuchin, Editor(s)
PDF: 9 pages
Proc. SPIE 2082, Quantification and Localization Using Diffuse Photons in a Highly Scattering Medium, (1 February 1994); doi: 10.1117/12.167450
Show Author Affiliations
Dmitry A. Zimnyakov, Blagonravov Mechanical Engineering Institute (Russia)
Serge A. Lepestkin, Blagonravov Mechanical Engineering Institute (Russia)
I. I. Polyakov, Blagonravov Mechanical Engineering Institute (Russia)
Serge A. Lepestkin, Blagonravov Mechanical Engineering Institute (Russia)
I. I. Polyakov, Blagonravov Mechanical Engineering Institute (Russia)
Valery V. Tuchin, Saratov State Univ. (Russia)
Sergei R. Utz M.D., Institute of Rural Hygiene (Russia)
Sergei R. Utz M.D., Institute of Rural Hygiene (Russia)
Published in SPIE Proceedings Vol. 2082:
Quantification and Localization Using Diffuse Photons in a Highly Scattering Medium
Britton Chance; David T. Delpy; Marco Ferrari; Martin J. C. van Gemert; Gerhard J. Mueller; Valery V. Tuchin, Editor(s)
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