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Proceedings Paper

High-temperature sapphire extrinsic Fizeau interferometer for strain measurements on silicon carbide materials
Author(s): Tuan A. Tran; Jonathan A. Greene; M. Alcock; Kent A. Murphy; Russell G. May; Anbo Wang; George Z. Wang; Richard O. Claus; Jack E. Coate
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Paper Abstract

A high-temperature sapphire strain gage based on the in-line extrinsic fiber- optic Fizeau interferometer was used to measure strain imparted by a 4000 lb compressive load applied at a temperature of 1100 degree(s)C. Experimental strain sensitivities on the order of 1 (mu) (epsilon) were obtained.

Paper Details

Date Published: 7 February 1994
PDF: 8 pages
Proc. SPIE 2072, Fiber Optic Physical Sensors in Manufacturing and Transportation, (7 February 1994); doi: 10.1117/12.166851
Show Author Affiliations
Tuan A. Tran, Fiber and Sensors Technologies, Inc. (United States)
Jonathan A. Greene, Fiber and Sensors Technologies, Inc. (United States)
M. Alcock, Fiber and Sensors Technologies, Inc. (United States)
Kent A. Murphy, Virginia Polytechnic Institute and State Univ. (United States)
Russell G. May, Virginia Polytechnic Institute and State Univ. (United States)
Anbo Wang, Virginia Polytechnic Institute and State Univ. (United States)
George Z. Wang, Virginia Polytechnic Institute and State Univ. (United States)
Richard O. Claus, Virginia Polytechnic Institute and State Univ. (United States)
Jack E. Coate, Air Force Wright Lab. (United States)


Published in SPIE Proceedings Vol. 2072:
Fiber Optic Physical Sensors in Manufacturing and Transportation
John W. Berthold III; Richard O. Claus; Michael A. Marcus; Robert S. Rogowski, Editor(s)

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