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Proceedings Paper

Application of nonalgorithmic techniques to the analysis of optical Fourier transforms for quality evaluation of small objects
Author(s): David J. Search; Clifford Allan Hobson; John T. Atkinson; A. Kenneth Porter
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Paper Abstract

The feasibility of using diffraction pattern analysis for the quality assessment of small components, with a specific application aimed at electronic components, is discussed. An electro-optical system for the capture of reflected diffraction patterns is presented. Preliminary simulation results for simple faults have been obtained and are used to illustrate the described feature vector and neural network classifier.

Paper Details

Date Published: 10 December 1993
PDF: 10 pages
Proc. SPIE 2003, Interferometry VI: Techniques and Analysis, (10 December 1993); doi: 10.1117/12.165467
Show Author Affiliations
David J. Search, Liverpool John Moores Univ. (United Kingdom)
Clifford Allan Hobson, Liverpool John Moores Univ. (United Kingdom)
John T. Atkinson, Liverpool John Moores Univ. (United Kingdom)
A. Kenneth Porter, Liverpool John Moores Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 2003:
Interferometry VI: Techniques and Analysis
Osuk Y. Kwon; Gordon M. Brown; Malgorzata Kujawinska, Editor(s)

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