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Proceedings Paper

Phase stepping: application to high-resolution moire
Author(s): Yves Surrel; Bing Zhao
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Paper Abstract

The application of phase-stepping to moire is presented. An analysis of the precision attainable with this technique shows that a resolution comparable to that of strain gauges is possible. We present preliminary experimental results from computer aided processing of phase-shifted moire fringe patterns (software FRANGYNE developed in our laboratory). Although this software is not specific, only results from in-plane moire are presented. Our moire setup consists of a CCD camera whose sensor acts as the reference grid. The phase shift is obtained by translating the camera perpendicular to the optical axis. The experimental results concern isotropic and anisotropic materials, and show the potential interest of such a technique in the field of experimental mechanics.

Paper Details

Date Published: 10 December 1993
PDF: 12 pages
Proc. SPIE 2003, Interferometry VI: Techniques and Analysis, (10 December 1993); doi: 10.1117/12.165449
Show Author Affiliations
Yves Surrel, Ecole des Mines de Saint-Etienne (France)
Bing Zhao, Ecole des Mines de Saint-Etienne (France)

Published in SPIE Proceedings Vol. 2003:
Interferometry VI: Techniques and Analysis
Osuk Y. Kwon; Gordon M. Brown; Malgorzata Kujawinska, Editor(s)

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