Share Email Print

Proceedings Paper

Digital microradiography and computed microtomography of NPR target particles
Author(s): Bruce E. Kinchen
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A requirement for production line characterization of the physical parameters of the new production reactor (NPR) target particles leads to the investigation of the use of digital, electronic micro-x-radiography and micro-x-ray computed tomography for this purpose. The target particles consist of concentric shells of various materials about a spherical nucleus of lithium aluminate. The outer diameter of the particle is 991 microns (0.039 in.) and the thinnest shell thickness is 25.4 microns (0.001 in.). The densities of the materials range from 0.7 gm/cm3 to 3.2 gm/cm3. The principal requirement was to measure accurately the diameter of the nucleus and the thickness of the four spherical shells. In order to accomplish the objective, an area, x-ray imager was designed with a calculated resolving power of 2 microns. The imager consisted of a cooled CCD, classical lens optics and an x-ray to visible light converter capable of very high spatial resolution. The system modulation transfer function was experimentally determined, and indicated a limiting resolution of about 100 1p/mm. This imager was used with a conventional x-ray source to acquire x-ray images that resolved the various shells of the pellet in a traditional 2-D manner. The same imager was used to obtain the projections required for computed tomography images. The images obtained from both techniques successfully provided the resolution to characterize the target particles in terms of spatial dimensions and material density.

Paper Details

Date Published: 16 December 1993
PDF: 15 pages
Proc. SPIE 2009, X-Ray Detector Physics and Applications II, (16 December 1993); doi: 10.1117/12.164745
Show Author Affiliations
Bruce E. Kinchen, Synergistic Detector Designs (United States)

Published in SPIE Proceedings Vol. 2009:
X-Ray Detector Physics and Applications II
Victor J. Orphan, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?