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Proceedings Paper

High-resolution monolithic delay-line readout techniques for two-dimensional microchannel plate detectors
Author(s): Oswald H. W. Siegmund; Mark A. Gummin; Joseph M. Stock; Daniel R. Marsh; Richard Raffanti; Jeffrey S. Hull
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Paper Abstract

Developments in high resolution double delay line (DDL) and cross delay line image readouts for applications in UV and soft X-ray imaging and spectroscopy are described. Our current DDL's achieve approximately equals 15 micrometers X 25 micrometers FWHM over 65 X 15 mm (> 4000 X 500 resolution elements) with counting rates of > 105 (10% dead time), good linearity (+/- approximately equals 1 resolution element) and high stability. We have also developed 65 mm X 15 mm multilayer cross delay line anodes with external serpentine delay lines which currently give approximately equals 20 micrometers FWHM resolution in both axes, with good linearity (approximately equals 30 micrometers ) and flat field performance. State of the art analog to digital converter and digital signal processor technology have been employed to develop novel event position encoding electronics with high count rate capability (2 X 105 events sec-1).

Paper Details

Date Published: 19 November 1993
PDF: 12 pages
Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); doi: 10.1117/12.162851
Show Author Affiliations
Oswald H. W. Siegmund, Univ. of California/Berkeley (United States)
Mark A. Gummin, Univ. of California/Berkeley (United States)
Joseph M. Stock, Univ. of California/Berkeley (United States)
Daniel R. Marsh, Univ. of California/Berkeley (United States)
Richard Raffanti, Univ. of California/Berkeley (United States)
Jeffrey S. Hull, Univ. of California/Berkeley (United States)

Published in SPIE Proceedings Vol. 2006:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV
Oswald H. W. Siegmund, Editor(s)

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