Proceedings Paper
Performance of back-illuminated Tektronix CCDs in the extreme ultraviolet| Format | Member Price | Non-Member Price |
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Paper Abstract
The quantum efficiency (QE) and flat field characteristics of back-illuminated 1024 X 1024 Tektronix CCDs have been measured in the extreme ultraviolet (EUV) between 44 and 1216 angstroms. These CCDs have been fabricated for the focal plane detector of the Extreme-ultraviolet Imaging Telescope (EIT) on the Solar and Heliospheric Observing spacecraft. The back-side surface of the EIT CCDs have been specially processed to enhance and stabilize the EUV QE. All requirements for QE are met by these devices, although a poorly understood variation of QE with temperature will complicate data analysis.
Paper Details
Date Published: 19 November 1993
PDF: 6 pages
Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); doi: 10.1117/12.162837
Published in SPIE Proceedings Vol. 2006:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV
Oswald H. W. Siegmund, Editor(s)
PDF: 6 pages
Proc. SPIE 2006, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV, (19 November 1993); doi: 10.1117/12.162837
Show Author Affiliations
J. Daniel Moses, Naval Research Lab. (United States)
Russell A. Howard, Naval Research Lab. (United States)
Dennis Wang, Naval Research Lab. (United States)
Richard C. Catura, Lockheed Palo Alto Research Lab. (United States)
James R. Lemen, Lockheed Palo Alto Research Lab. (United States)
Russell A. Howard, Naval Research Lab. (United States)
Dennis Wang, Naval Research Lab. (United States)
Richard C. Catura, Lockheed Palo Alto Research Lab. (United States)
James R. Lemen, Lockheed Palo Alto Research Lab. (United States)
Lawrence Shing, Lockheed Palo Alto Research Lab. (United States)
Robert A. Stern, Lockheed Palo Alto Research Lab. (United States)
Jean-Francois E. Hochedez, Consultant Scientifique (Belgium)
Jean-Pierre Delaboudiniere, Institut d'Astrophysique Spatiale (France)
Robert A. Stern, Lockheed Palo Alto Research Lab. (United States)
Jean-Francois E. Hochedez, Consultant Scientifique (Belgium)
Jean-Pierre Delaboudiniere, Institut d'Astrophysique Spatiale (France)
Published in SPIE Proceedings Vol. 2006:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IV
Oswald H. W. Siegmund, Editor(s)
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