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Proceedings Paper

Bulk scatter measurements in fused silica at two wavelengths: a comparison with Rayleigh scatter theory
Author(s): James Paul Black; Kirt C. Hickman
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Paper Abstract

Angle resolved scattering from bulk fused silica substrates has been measured at .442 micrometers and .633 micrometers . The angle dependent scatter pattern and wavelength dependence are compared to Rayleigh scatter theory. The measured bulk scatter data is applied to the measurement of fused silica substrate total scatter and the resulting measurement limitations imposed by bulk scatter.

Paper Details

Date Published: 1 December 1993
PDF: 12 pages
Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); doi: 10.1117/12.162656
Show Author Affiliations
James Paul Black, Rockwell International Corp. (United States)
Kirt C. Hickman, Air Force Phillips Lab. (United States)

Published in SPIE Proceedings Vol. 1995:
Optical Scattering: Applications, Measurement, and Theory II
John C. Stover, Editor(s)

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