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Proceedings Paper

Wavelength scaling investigation of several materials
Author(s): John C. Stover; Marvin L. Bernt; Charles M. Egert
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Paper Abstract

A logical approach to investigating materials that scatter non-topographically is to coat them with a thin layer that scatters only topographically (i.e., a layer that wavelength scales) so that the two scatter sources can be separated. This technique has been used to study scatter from beryllium mirrors using layers of aluminum and gold. In the course of these investigations it was learned that many aluminum surfaces do not wavelength scale (no information was available on gold). This was discovered fairly late in the study and caused a lot of extra expense and frustration. This paper presents wavelength scaling data from the uv to the mid-IR for several materials. The intention is to provide guidance for future studies of this nature.

Paper Details

Date Published: 1 December 1993
PDF: 11 pages
Proc. SPIE 1995, Optical Scattering: Applications, Measurement, and Theory II, (1 December 1993); doi: 10.1117/12.162654
Show Author Affiliations
John C. Stover, TMA Technologies, Inc. (United States)
Marvin L. Bernt, TMA Technologies, Inc. (United States)
Charles M. Egert, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 1995:
Optical Scattering: Applications, Measurement, and Theory II
John C. Stover, Editor(s)

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