Proceedings Paper
New electronic shearing speckle pattern interferometer with continuously variable sensitivity| Format | Member Price | Non-Member Price |
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Paper Abstract
A new Electronic Shearing Speckle Pattern Interferometer (ESSPI) with continuously variable sensitivity is described. This new instrument not only provides variable sensitivity and improved shearing range but it also increases the maximum shearing sensitivity. It will be well suited to nondestructive testing applications in industry.
Paper Details
Date Published: 22 October 1993
PDF: 4 pages
Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, (22 October 1993); doi: 10.1117/12.162091
Published in SPIE Proceedings Vol. 2066:
Industrial Optical Sensing and Metrology: Applications and Integration
Kevin G. Harding; H. Philip Stahl, Editor(s)
PDF: 4 pages
Proc. SPIE 2066, Industrial Optical Sensing and Metrology: Applications and Integration, (22 October 1993); doi: 10.1117/12.162091
Show Author Affiliations
Po Sheun Chung, City Polytechnic of Hong Kong (Hong Kong)
Published in SPIE Proceedings Vol. 2066:
Industrial Optical Sensing and Metrology: Applications and Integration
Kevin G. Harding; H. Philip Stahl, Editor(s)
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