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Proceedings Paper

Fractal behavior of thin-film tungsten oxide electrodes
Author(s): Kathleen A. MacDonald; John M. Bell; Joanna Barczynska; G. Voelkel
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Paper Abstract

Tungsten oxide thin films prepared by a dip-coating process show great promise as the electrochromic layer in optically switchable windows. Current models describe the electrochemical response of electrochromic evaporated or anodized WO3 thin films, using conventional chronoamperometric theory applied to a two-dimensional electrode. Here, we place emphasis on electrochemical ion diffusion in and through a non-two-dimensional thin- film electrode using a liquid electrolyte, in order to characterize the current-time (i-t) and current-voltage response. In particular, these characteristics can be related to the thickness, surface roughness and microstructure of the film using fractal theory. Complimentary microstructural analyses of these films are carried out using electron and atomic force microscopic techniques, with particular attention focussed on the effects of ion intercalation on the microstructure of sol-gel deposited thin films.

Paper Details

Date Published: 22 October 1993
PDF: 9 pages
Proc. SPIE 2017, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XII, (22 October 1993); doi: 10.1117/12.161950
Show Author Affiliations
Kathleen A. MacDonald, Univ. of Technology Sydney (United States)
John M. Bell, Univ. of Technology Sydney (Australia)
Joanna Barczynska, Univ. of Technology Sydney (Australia)
G. Voelkel, Monash Univ. (Australia)

Published in SPIE Proceedings Vol. 2017:
Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XII
Carl M. Lampert, Editor(s)

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