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Proceedings Paper

Electronic speckle pattern interferometer for the measurement of object vibration mode
Author(s): Fu-Ming Juang; Nai-Que Wang; Jiann-Cherng Doong; Ming-Wen Chang; Yeon-Sheng Yang; Yuen-Sum Liu
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Paper Abstract

An analysis of fringe contrast in electronic speckle pattern interferometer by using double slit aperture with larger slit width is presented. To improve the vibration pattern contrast of object a subtraction technique is adapted and result is shown. For such an improvement this setup will be suitable to be used in severe vibration circumstance.

Paper Details

Date Published: 22 September 1993
PDF: 7 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156478
Show Author Affiliations
Fu-Ming Juang, National Central Univ. (Taiwan)
Nai-Que Wang, National Central Univ. (Taiwan)
Jiann-Cherng Doong, National Central Univ. (Taiwan)
Ming-Wen Chang, National Central Univ. (Taiwan)
Yeon-Sheng Yang, Chung Shan Institute of Science and Technology (Taiwan)
Yuen-Sum Liu, Chung Shan Institute of Science and Technology (Taiwan)

Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments
Li Zhu, Editor(s)

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