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Proceedings Paper

Synthetic measuring deviation of the cantilever coordinate-measuring machine
Author(s): David Shu; Ya-Xun Zhou
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Paper Abstract

A high precision plate is placed in a quadrant ( I II III IV quadrants) with two posit ions, and with direction cosines of the machine coordinate axes X,Y,Z. When inpute X, Y ; YZ; or Z, X values, then there are output Z ; X ; or Y , Therefore,the difference between the output and the third axis with own component error will be the synthetical measuring deviation. At present we create a mathematical model to describe the interaction of the error components and the synthetical measuring deviation. According to this model, we can obtain the error components from the synthetic deviation.

Paper Details

Date Published: 22 September 1993
PDF: 6 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156411
Show Author Affiliations
David Shu, Ningbo Univ. (China)
Ya-Xun Zhou, Ningbo Univ. (China)

Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments
Li Zhu, Editor(s)

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