Share Email Print

Proceedings Paper

Research on a new measuring and analyzing system for curved surface topography
Author(s): Xiangqian Jiang; Ting-Xi Gu; Zhu Li
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this paper, a new measuring and analysing system for curved surfaces topography is described. The system working principle is discussed. The photoelectric signal processing,hardware and software designing and the model of data processing about curved surfaces are also investigated.Finally, experimental results are given.

Paper Details

Date Published: 22 September 1993
PDF: 5 pages
Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156374
Show Author Affiliations
Xiangqian Jiang, Huazhong Univ. of Science and Technology (China)
Ting-Xi Gu, Beijing Scientific Instrument Factory (China)
Zhu Li, Huazhong Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 2101:
Measurement Technology and Intelligent Instruments
Li Zhu, Editor(s)

© SPIE. Terms of Use
Back to Top