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Proceedings Paper

Modification of m-line spectroscopy for single-mode waveguides
Author(s): Marcin Roszko; Elzbieta Augusciuk; Elzbieta Skulska
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Paper Abstract

In optical planar and/or channel waveuides, determination of two parameters such as: the depth and the waveguide index with the use of the rn-line spectroscopy (prism coupling method) involves measuring of at least two coupling angles of the guiding modes. Most of integrated optical devices operate in sigle-mode regime but such devices developed for 2-nd and 3-rd transmission windows are multimodal within the VIS range thus the conventional rn-line study with the use of the He-Ne laser yields in evaluation of the waveguide parameters under examination. However, the conventional m-line procedure of the determination of the waveuide parameters fails for single-mode structures developed for the application within the VIS-range. A method presented in the paper involves an additional two-beam interferometric examination of the slab with a waveguiding structure. The interference of the beams reflected from the upper and lower surfaces of the slab results in a fringe pattern. Within the region of the waveguide boundary one observes the fringe shift related to the difference of optical paths of the beams in- and outside of the waveguide. The microscopic study of that fringe pattern results in an additional relation of the waveguide depth and its index. A substitution of the waveguide depth by the last relation results in a modified modal eqaution for the waveguide index that can be solved by conventional numerical methods.

Paper Details

Date Published: 24 September 1993
PDF: 4 pages
Proc. SPIE 1711, High-Performance Optical Spectrometry, (24 September 1993); doi: 10.1117/12.155672
Show Author Affiliations
Marcin Roszko, Warsaw Univ. of Technology (Poland)
Elzbieta Augusciuk, Warsaw Univ. of Technology (Poland)
Elzbieta Skulska, Warsaw Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 1711:
High-Performance Optical Spectrometry
Maksymilian Pluta; Aleksandra Kopystynska; Mariusz Szyjer, Editor(s)

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