
Proceedings Paper
Normalized detectivity as a function of diffusion length for SPRITE detectorsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
This paper suggests a method for normalization of D* for SPRITE detectors with respect to MTF-limiting parameters, primarily the diffusion spread. The purpose of the normalization is to obtain a single performance parameter for the SPRITE detector to make it more objectively comparable with conventional detectors with discrete elements. The recalculation ratio is the rms noise calculated with a filter that compensates the impulse response back to a square pulse divided by the rms noise of the SPRITE element with no compensating filters. In this paper two filters are used: one that fully compensates back to a square impulse response, and one that compensates the MTF at two selected frequencies. The recalculation ratio is calculated as a function of diffusion length with the ratio element length/(carrier life time* scan speed) (L/vt) as a parameter. The results show very little variation with L/vt, so the results should be valid for most applications for the SPRITE detector.
Paper Details
Date Published: 31 August 1993
PDF: 11 pages
Proc. SPIE 1969, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV, (31 August 1993); doi: 10.1117/12.154710
Published in SPIE Proceedings Vol. 1969:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV
Gerald C. Holst, Editor(s)
PDF: 11 pages
Proc. SPIE 1969, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV, (31 August 1993); doi: 10.1117/12.154710
Show Author Affiliations
Per Fredin, Saab Missiles AB (Sweden)
Glenn D. Boreman, CREOL/Univ. of Central Florida (United States)
Published in SPIE Proceedings Vol. 1969:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing IV
Gerald C. Holst, Editor(s)
© SPIE. Terms of Use
