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Proceedings Paper

Microstructure of erasable optic disk thin film investigated by STM/AFM
Author(s): Zhanghua Wu; Fuxi Gan
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Paper Abstract

The microstructure of sputtered amorphous magneto-optic media TbFeCo is observed by self- designed scanning tunneling microscopy (STM), and tracks in phase-change media are recorded. GeSbTe is also investigated by atomic force microscopy.

Paper Details

Date Published: 13 August 1993
PDF: 5 pages
Proc. SPIE 2053, Optical Storage (ISOS '92), (13 August 1993); doi: 10.1117/12.150649
Show Author Affiliations
Zhanghua Wu, Shanghai Institute of Optics and Fine Mechanics (China)
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics (China)

Published in SPIE Proceedings Vol. 2053:
Optical Storage (ISOS '92)
Fuxi Gan, Editor(s)

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