
Proceedings Paper
Qualitative and quantitative techniques for 3D shape inspection of industrial artifactsFormat | Member Price | Non-Member Price |
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Paper Abstract
Opto-electronic sensing methods are increasingly being used for the inspection of manufactured goods. Such systems have the advantage of being non-contact methods, and are fast and flexible. One particular aspect of inspection is the measurement of three-dimensional shape. Even in shape measurement, there is a wide range of requirements. Some components, such as mechanical parts, may have exacting geometric requirements if they are to function correctly. Here, inspection is concerned with checking geometric details. Correctness of other objects such as loaves of bread is much more difficult to pin down, and symbolic methods are more appropriate than high-precision numerical methods. This paper considers a range of inspection tasks, and appropriate methods for carrying them out using visual sensing techniques.
Paper Details
Date Published: 6 August 1993
PDF: 11 pages
Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); doi: 10.1117/12.150298
Published in SPIE Proceedings Vol. 2064:
Machine Vision Applications, Architectures, and Systems Integration II
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)
PDF: 11 pages
Proc. SPIE 2064, Machine Vision Applications, Architectures, and Systems Integration II, (6 August 1993); doi: 10.1117/12.150298
Show Author Affiliations
Bruce G. Batchelor, Univ. of Wales College Cardiff (United Kingdom)
A. David Marshall, Univ. of Wales College Cardiff (United Kingdom)
A. David Marshall, Univ. of Wales College Cardiff (United Kingdom)
Ralph R. Martin, Univ. of Wales College Cardiff (United Kingdom)
Published in SPIE Proceedings Vol. 2064:
Machine Vision Applications, Architectures, and Systems Integration II
Bruce G. Batchelor; Susan Snell Solomon; Frederick M. Waltz, Editor(s)
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